DataCard | Intraratio

Real-Time Quality, Yield and IoT Data Storage and Management

Test, assembly, machine, sensor, and supplier data capture, with advanced analytics and SPC

Component genealogy, control charts, trend charts, histograms, box plots, wafer and PCBA substrate mapping, and more

Why DataCard?

Real-time product, machine, sensor and supplier data capture for advanced reporting and automation

DataCard is a powerful and intuitive yield management system that automatically captures and stores tester, machine, sensor and supplier data in real-time, with production yield and asset performance monitoring, device characterization analysis, genealogy traceability, all in a single platform

Enables real-time data capture of IIoT machine, sensor, test, inspection, wafer, assembly map, printed circuit board assembly, log data, and more

Deployed on premises, cloud or hybrid, and accessible from a secure browser connection anywhere on your network

Configured as a stand-alone system, or integrated directly with our MES solution for expanded automated quality control capabilities

Self managed, with automated administration monitors and alerts, and Zero dedicated IT required

Advanced
Analytics

Statistical & yield trends, paretos
Device characterization
Substrate mapping: wafer, stripline, PCBA
Genealogy
Root cause analysis
Customized analytics with outlier exclusion

Powerful
Capabilities

Direct integration with computing tools: JMP, MATLAB, LabVIEW, Minitab, and others
Improved data accuracy for yield and quality costs reportings (ERP)
Fully automated localisation of yield impactors in real-time
Seamless scalability

Key Benefits

Yield and output improvement
Significant reduction in time and costs to identify and fix yield and defect issues
Quality Cost Reduction (defect cost * no of occurences)

Dashboard Reporting

See real-time production statistical analysis, from defect and genealogy traceability to New Product Introduction (NPI) and device characterization analysis, all in one solution

Instantly access chart libraries that include parametric trends and distributions, defect and bin paretos, wafer and substrate maps, and more, including the ability to generate customized reports for more targeted analyses

Data Mining

Access full contextual data from external software such as Python, R, JMP, MatLab, LabVIEW, Minitab, and more, leveraging new data capabilities such as AI / Machine Learning in order to deliver deeper insights and data automation across your organization

Automate connectivity and query management, removing the need for costly database administration

System Administration

Automated monitors ensure that user connections and queries are valid and performant, removing the need for dedicated database administration

All the tools for managing data feeds and users are available in simple to use interfaces, requiring near-zero IT resources to support

Data Search & Filtering

Filter data searches by Product, Lot, Sub-lot, Wafer, Product Family, Serial Number, Program, Process and more, for an intuitive and powerful user experience

Store all factory generated test, assembly and sensor data for rapid retrieval and analysis, including all logical, parametric and applied condition data

Integration & Automation

Remove the need for 3rd party software with direct connectivity to data sources, enabling rapid and scalable integration

Create product line specific dashboard monitors for live, real-time broadcast on the shop floor

Configure test and measurement systems to directly query data for feed-forward quality control analysis, and advanced outlier screening, allowing automated yield excursion controls to be implemented on the factory floor

Data Sources

Provides built-in support for standard data types and protocols including XML, TXT, CSV, STDF, ATDF, PD5, KLA, SINF, SEMI, and more, while also delivering support for test and assembly machine systems such as Teradyne, Agilent/HP, Credence, BESI, AifoTech, KLA and hundreds of others

Supports supplier data sources including TSMC, Global Foundries, Tower Semiconductor, ASE, Amkor, STMicroelectronics, Delta Electronics, Fabrinet, SOITEC, IMT, and many more

Provides customized data parsers for any source

Real-Time Quality, Yield and IoT Data Storage and Management

Test, assembly, machine, sensor, and supplier data capture, with advanced analytics and SPC

Component genealogy, control charts, trend charts, histograms, box plots, wafer and PCBA substrate mapping, and more