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Change Control Management

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Inventory Control & Traceability

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Planning & Resource Management

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Semiconductor & MEMS Wafer Analytics

Intraratio’s solutions track today’s most complex assembly and test processes. Serving high performance computing, communications, space/military, automotive and medical device industries.

We solve this by capturing data automatically, from within fab, to inspection, wafer probe, assembly and test. Our RunCard, DataCard & ServiceCard applications provide a comprehensive IT platform to manage your data interchange and production visibility needs.

 

Serialized Product Traceability

Serialized unit traceability provides for complete genealogy, including material and component supplier source information, product testing and QA results. Only Intraratio takes this to the next level, with integrated product yield and performance data. This rich set of data provides unparalleled ability to correlate production yield against all factory induced variables. Examples include yield correlation across process changes, operators, machines, software, firmware, and even physical product movement within carrier based containers. Deep traceability has been successfully achieved for products used in space and military communications systems currently in orbit, to advanced medical diagnostic systems using silicon photonics.

Test Yield & Quality Data Analytics

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User Access

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